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Plasma Etching to Enhance Visibility of Nano Particles in Nanocomposites

Kunigal N.Shivakumar1, Shivalingappa Lingaiah2, Robert Sadler2, Matthew Sharpe2

Research Professor and Director, Center for Composite Materials Research, Department of Mechanical Engineering, North Carolina A&T State University, Greensboro, NC 27411
Center for Composite Materials Research, North Carolina A&T State University, Greensboro, NC 27411

Computers, Materials & Continua 2004, 1(4), 309-318. https://doi.org/10.3970/cmc.2004.001.309

Abstract

The exfoliation and dispersion of nanoclay (2% by weight) and nanovermiculite (2% by weight) particles in a polymer matrix is analyzed using the Scanning Electron Microscope (SEM) after a low temperature air plasma etch. The plasma etch preferentially removes the polymer to expose the nanoparticles. Both Argon and air have been used as the etching media to study the etching process. SEM analysis illustrate the results of the etching in flat and edge surfaces of both nanoclay (MMT) and nanovermiculite (VMT) filled polymer. Both the MMT and VMT were dispersed using a IKA high shear mixer and a Sonicator.

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K. . N.Shivakumar, S. . Lingaiah, R. . Sadler and M. . Sharpe, "Plasma etching to enhance visibility of nano particles in nanocomposites," Computers, Materials & Continua, vol. 1, no.4, pp. 309–318, 2004.



cc This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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