%0 Journal Article %A Jia, Fei %A Zheng, Xiu-Peng %A Cao, Yan-Ping %A Feng, Xi-Qiao %D 2010 %J Computers, Materials \& Continua %@ 1546-2226 %V 18 %N 2 %P 105--120 %T Theoretical Study on the Bilayer Buckling Technique for Thin Film Metrology %M doi:10.3970/cmc.2010.018.105 %U http://www.techscience.com/cmc/v18n2/22568