Table of Content

Open Access iconOpen Access

ARTICLE

Measurements of the Curvature of Protrusions/Retrusions on Migrating Recrystallization Boundaries

by Y.B. Zhang1, A. Godfrey2, D. Juul Jensen1

Danish-Chinese Center for Nanometals, Materials Research Division, RisøNational Laboratory for Sustainable Energy, Technical University of Denmark, DK-4000 Roskilde Denmark
Laboratory of Advanced Materials, Dept. Material Science and Engineering, Tsinghua University, Beijing 100084, P.R. China

Computers, Materials & Continua 2009, 14(3), 197-208. https://doi.org/10.3970/cmc.2009.014.197

Abstract

Two methods to quantify protrusions/retrusions and to estimate local boundary curvature from sample plane sections are proposed. The methods are used to evaluate the driving force due to curvature of the protrusions/retrusions for partially recrystallized pure nickel cold rolled to 96% reduction in thickness. The results reveal that the values calculated by both these methods are reasonable when compared with the stored energy measured by differential scanning calorimetry. The relationship between protrusions and the average stored energy density in the deformed matrix is also investigated for partially recrystallized pure aluminum cold rolled to 50%. The results show that the local deformed microstructure as well as local heterogeneities have to be analyzed in order to understand the formation of the protrusions.

Keywords


Cite This Article

APA Style
Zhang, Y., Godfrey, A., Jensen, D.J. (2009). Measurements of the curvature of protrusions/retrusions on migrating recrystallization boundaries. Computers, Materials & Continua, 14(3), 197-208. https://doi.org/10.3970/cmc.2009.014.197
Vancouver Style
Zhang Y, Godfrey A, Jensen DJ. Measurements of the curvature of protrusions/retrusions on migrating recrystallization boundaries. Comput Mater Contin. 2009;14(3):197-208 https://doi.org/10.3970/cmc.2009.014.197
IEEE Style
Y. Zhang, A. Godfrey, and D. J. Jensen, “Measurements of the Curvature of Protrusions/Retrusions on Migrating Recrystallization Boundaries,” Comput. Mater. Contin., vol. 14, no. 3, pp. 197-208, 2009. https://doi.org/10.3970/cmc.2009.014.197



cc Copyright © 2009 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
  • 1674

    View

  • 1456

    Download

  • 0

    Like

Share Link