TY - EJOU AU - Adams, Brent L. AU - Kacher, Joshua TI - EBSD-Based Microscopy: Resolution of Dislocation Density T2 - Computers, Materials \& Continua PY - 2009 VL - 14 IS - 3 SN - 1546-2226 AB - Consideration is given to the resolution of dislocation density afforded by EBSD-based scanning electron microscopy. Comparison between the conventional Hough- and the emerging high-resolution cross-correlation-based approaches is made. It is illustrated that considerable care must be exercised in selecting a step size (Burger's circuit size) for experimental measurements. Important variables affecting this selection include the dislocation density and the physical size and density of dislocation dipole and multi-pole components of the structure. It is also illustrated that simulations can be useful to the interpretation of experimental recoveries. KW - electron diffraction KW - EBSD KW - dislocation density tensor DO - 10.3970/cmc.2009.014.185