%0 Journal Article %A Adams, Brent-L. %A Kacher, Joshua %D 2009 %J Computers, Materials \& Continua %@ 1546-2226 %V 14 %N 3 %P 185--196 %T EBSD-Based Microscopy: Resolution of Dislocation Density %M doi:10.3970/cmc.2009.014.185 %U http://www.techscience.com/cmc/v14n3/22513