Login
Register
Submit a Paper
Propose a Special lssue
Open Access
ARTICLE
EBSD-Based Microscopy: Resolution of Dislocation Density
Computers, Materials & Continua 2009, 14(3), 185-196. https://doi.org/10.3970/cmc.2009.014.185
Download PDFAbstract
Consideration is given to the resolution of dislocation density afforded by EBSD-based scanning electron microscopy. Comparison between the conventional Hough- and the emerging high-resolution cross-correlation-based approaches is made. It is illustrated that considerable care must be exercised in selecting a step size (Burger's circuit size) for experimental measurements. Important variables affecting this selection include the dislocation density and the physical size and density of dislocation dipole and multi-pole components of the structure. It is also illustrated that simulations can be useful to the interpretation of experimental recoveries.Keywords
Cite This Article
APA Style
Adams, B.L., Kacher, J. (2009). Ebsd-based microscopy: resolution of dislocation density. Computers, Materials & Continua, 14(3), 185-196. https://doi.org/10.3970/cmc.2009.014.185
Vancouver Style
Adams BL, Kacher J. Ebsd-based microscopy: resolution of dislocation density. Comput Mater Contin. 2009;14(3):185-196 https://doi.org/10.3970/cmc.2009.014.185
IEEE Style
B.L. Adams and J. Kacher, "EBSD-Based Microscopy: Resolution of Dislocation Density," Comput. Mater. Contin., vol. 14, no. 3, pp. 185-196. 2009. https://doi.org/10.3970/cmc.2009.014.185
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Downloads
Citation Tools
