Open Access

ARTICLE

Young's Modulus Measurement of Thin Films by Resonant Frequency Method Using Magnetostrictive Resonator

Hao-Miao Zhou¹, Fang Li¹, Qiang Ye¹, Ji-Xiang Zhao¹, Zhe-Lei Xia¹, YingTang², Jing Wei³

1 College of Information Engineering, China Jiliang University, Hangzhou, 310018, China. Tel: 086-0571-87676215; email: zhouhm@cjlu.edu.cn
2 College of Optical and Electronic Technology, China Jiliang University, Hangzhou, 310018, China
3 College of Foreign Languages, Zhejiang Gongshang University, Hangzhou, 310018, P. R. China