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HRAM-VITON: High-Resolution Virtual Try-On with Attention Mechanism

Yue Chen1, Xiaoman Liang1,2,*, Mugang Lin1,2, Fachao Zhang1, Huihuang Zhao1,2

1 College of Computer Science and Technology, Hengyang Normal University, Hengyang, 421002, China
2 Hunan Provincial Key Laboratory of Intelligent Information Processing and Application, Hengyang, 421002, China

* Corresponding Author: Xiaoman Liang. Email: email

Computers, Materials & Continua 2025, 82(2), 2753-2768. https://doi.org/10.32604/cmc.2024.059530

Abstract

The objective of image-based virtual try-on is to seamlessly integrate clothing onto a target image, generating a realistic representation of the character in the specified attire. However, existing virtual try-on methods frequently encounter challenges, including misalignment between the body and clothing, noticeable artifacts, and the loss of intricate garment details. To overcome these challenges, we introduce a two-stage high-resolution virtual try-on framework that integrates an attention mechanism, comprising a garment warping stage and an image generation stage. During the garment warping stage, we incorporate a channel attention mechanism to effectively retain the critical features of the garment, addressing challenges such as the loss of patterns, colors, and other essential details commonly observed in virtual try-on images produced by existing methods. During the image generation stage, with the aim of maximizing the utilization of the information proffered by the input image, the input features undergo double sampling within the normalization procedure, thereby enhancing the detail fidelity and clothing alignment efficacy of the output image. Experimental evaluations conducted on high-resolution datasets validate the effectiveness of the proposed method. Results demonstrate significant improvements in preserving garment details, reducing artifacts, and achieving superior alignment between the clothing and body compared to baseline methods, establishing its advantage in generating realistic and high-quality virtual try-on images.

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APA Style
Chen, Y., Liang, X., Lin, M., Zhang, F., Zhao, H. (2025). HRAM-VITON: high-resolution virtual try-on with attention mechanism. Computers, Materials & Continua, 82(2), 2753–2768. https://doi.org/10.32604/cmc.2024.059530
Vancouver Style
Chen Y, Liang X, Lin M, Zhang F, Zhao H. HRAM-VITON: high-resolution virtual try-on with attention mechanism. Comput Mater Contin. 2025;82(2):2753–2768. https://doi.org/10.32604/cmc.2024.059530
IEEE Style
Y. Chen, X. Liang, M. Lin, F. Zhang, and H. Zhao, “HRAM-VITON: High-Resolution Virtual Try-On with Attention Mechanism,” Comput. Mater. Contin., vol. 82, no. 2, pp. 2753–2768, 2025. https://doi.org/10.32604/cmc.2024.059530



cc Copyright © 2025 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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