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Transcatheter Ventricular Septal Defect Closure with Nit-Occlud Lê VSD Device—Five Years’ Experience and Literature Review

by Ivana B. Cerović1, Vladislav A. Vukomanović1,2, Jovan Lj. Košutić1,2, Mila S. Stajević1,2, Sanja S. Ninić1, Saša S. Popović1, Ivan D. Dizdarević1, Staša D. Krasić1, Sergej M. Prijić1,2,*

1 Cardiology Department, Mother and Child Health Institute of Serbia “Dr Vukan Čupić”, Belgrade, 11070, Serbia
2 Faculty of Medicine, University of Belgrade, Belgrade, 11070, Serbia

* Corresponding Author: Sergej M. Prijić. Email: email

Congenital Heart Disease 2023, 18(3), 361-371. https://doi.org/10.32604/chd.2023.026533

Abstract

Introduction: Transcatheter closure is an alternative to ventricular septal defect (VSD) occlusion surgery. Nit-Occlud Lê VSD coil is a new device yet to be evaluated. The study aimed to evaluate immediate and midterm results after transcatheter closure with the Nit-Occlud Lê VSD device. Methods: The retrospective analysis included 30 patients with VSD referred for closure during the period from October 2015 to December 2020. Results: At the time of intervention, the patients’ mean age and body weights were 7.5 ± 5.6 years and 29.3 ± 19.1 kg. The majority of the defects had perimembranous location (24/30), four defects had muscular and two outlet subaortic position. The mean effective right-side diameter of the VSDs was 3.6 ± 1.3 mm. Single ventricular fibrillation, device embolization, and hemolysis developed in different patients and were successfully treated. None of the patients had a complete atrioventricular block. The coil was successfully placed in 25/30 (83.3%) patients. The majority of the devices were 10 mm × 6 mm (11/25) and 12 mm × 8 mm (8/25) in size. Two patients required the implantation of a second device. The follow-up period was 2.1 ± 1.4 years. Complete VSD closure was achieved in 48% of cases immediately after the intervention, 74% during 2.1 ± 1.6 months after the procedure, and 81% over follow-up. The remaining patients had a trivial residual defect. During the follow-up, approximately one-third of patients developed trivial aortic and mitral valve regurgitation, and half of the patients acquired trace/mild tricuspid regurgitation. Standardized (z-score) left ventricular end-diastolic diameter (0.15 ± 0.37 vs. 0.92 ± 0.82, p = 0.005) and left atrium dimension (0.47 ± 0.58 vs. 1.89 ± 1.11, p = 0.005), as well as the left atrium to aortic root ratio (1.2 ± 0.1 vs. 1.4 ± 0.2, p = 0.005) showed a significant decrease over follow-up related to the period before intervention. Conclusion: Intervention with Nit-Occlud® Lê VSD coil showed appropriate results regarding VSD closure rate, complications, and chamber remodeling. The introduction of this device into clinical practice is a significant step forward in transcatheter perimembranous VSD occlusion.

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APA Style
Cerović, I.B., Vukomanović, V.A., Košutić, J.L., Stajević, M.S., Ninić, S.S. et al. (2023). Transcatheter ventricular septal defect closure with nit-occlud Lê VSD device—five years’ experience and literature review. Congenital Heart Disease, 18(3), 361-371. https://doi.org/10.32604/chd.2023.026533
Vancouver Style
Cerović IB, Vukomanović VA, Košutić JL, Stajević MS, Ninić SS, Popović SS, et al. Transcatheter ventricular septal defect closure with nit-occlud Lê VSD device—five years’ experience and literature review. Congeni Heart Dis. 2023;18(3):361-371 https://doi.org/10.32604/chd.2023.026533
IEEE Style
I. B. Cerović et al., “Transcatheter Ventricular Septal Defect Closure with Nit-Occlud Lê VSD Device—Five Years’ Experience and Literature Review,” Congeni. Heart Dis., vol. 18, no. 3, pp. 361-371, 2023. https://doi.org/10.32604/chd.2023.026533



cc Copyright © 2023 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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