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Analytical Solution for Single and Multiple impacts with Strain-rate Effects for Shot Peening

Baskaran Bhuvaraghan1, Sivakumar M Srinivasan2, Bob Maffeo3, Om Prakash4

GE Aviation, Bangalore, India.
Professor, Applied Mechanics, IIT Madras, Chennai.
Consulting Engineer, GE Aviation, USA.
GE Global Research, Bangalore

Computer Modeling in Engineering & Sciences 2010, 57(2), 137-158. https://doi.org/10.3970/cmes.2010.057.137

Abstract

Shot peening is a complex and random process which is controlled by many input parameters. Numerical methods, which are normally used for impact problems will prohibitively put strain on the computing resources since a large number of impacts are involved in the computations. In this paper, a simplified analytical approach is used to predict the residual compressive stress that includes strain-rate effects. This is based on the method proposed by with a simple modification to include the strain rate effects. The residual stresses are predicted in materials SAE1070 and Inco718. In the computations, the random variation of the input parameters are simulated to predict the residual stress variation using the Monte-Carlo method. The stress distributions computed using the analytical method compare well with the direct numerical methods and the experimental results.

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APA Style
Bhuvaraghan, B., Srinivasan, S.M., Maffeo, B., Prakash, O. (2010). Analytical solution for single and multiple impacts with strain-rate effects for shot peening. Computer Modeling in Engineering & Sciences, 57(2), 137-158. https://doi.org/10.3970/cmes.2010.057.137
Vancouver Style
Bhuvaraghan B, Srinivasan SM, Maffeo B, Prakash O. Analytical solution for single and multiple impacts with strain-rate effects for shot peening. Comput Model Eng Sci. 2010;57(2):137-158 https://doi.org/10.3970/cmes.2010.057.137
IEEE Style
B. Bhuvaraghan, S.M. Srinivasan, B. Maffeo, and O. Prakash, “Analytical Solution for Single and Multiple impacts with Strain-rate Effects for Shot Peening,” Comput. Model. Eng. Sci., vol. 57, no. 2, pp. 137-158, 2010. https://doi.org/10.3970/cmes.2010.057.137



cc Copyright © 2010 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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