Submit

Login Login

Register Register

Home/ Journals/ CMES/ Vol.35, No.1, 2008/ 10.3970/cmes.2008.035.001

Open Access iconOpen Access

ARTICLE

Strain Measurement in a Microstructure Using Digital Image Correlation for a Laser-Scanning Microscopic Image

N. Shishido, T. Ikeda, N. Miyazaki

TSP_CMES_1.pdf

  • 1389

    View

  • 995

    Download

  • 0

    Like

Copyright© 2024 Tech Science Press
© 1997-2024 TSP (Henderson, USA) unless otherwise stated

Share Link