Open Access
ARTICLE
A Simplified Model for Buckling and Post-Buckling Analysis of Cu Nanobeam Under Compression
Jiachen Guo1,2, Yunfei Xu2, Zhenyu Jiang1,*, Xiaoyi Liu2, Yang Cai2,*
1 Department of Engineering Mechanics, South China University of Technology, Guangzhou,
510640, China
2 The Peac Institute of Multiscale Sciences, Chengdu, 610031, China
∗ Corresponding Authors: Zhenyu Jiang. Email: ; Yang Cai. Email:
Computer Modeling in Engineering & Sciences 2020, 125(2), 611-623. https://doi.org/10.32604/cmes.2020.011148
Received 22 April 2020; Accepted 11 August 2020; Issue published 12 October 2020
Abstract
Both of Buckling and post-buckling are fundamental problems of
geometric nonlinearity in solid mechanics. With the rapid development of
nanotechnology in recent years, buckling behaviors in nanobeams receive
more attention due to its applications in sensors, actuators, transistors, probes,
and resonators in nanoelectromechanical systems (NEMS) and biotechnology. In this work, buckling and post-buckling of copper nanobeam under
uniaxial compression are investigated with theoretical analysis and atomistic
simulations. Different cross sections are explored for the consideration of
surface effects. To avoid complicated high order buckling modes, a stressbased simplified model is proposed to analyze the critical strain for buckling,
maximum deflection, and nominal failure strain for post-buckling. Surface
effects should be considered regarding critical buckling strain and the maximum post-buckling deflection. The critical strain increases with increasing
nanobeam cross section, while the maximum deflection increases with increasing loading strain but stays nearly the same for different cross sections, and the
underlying mechanisms are revealed by our model. The maximum deflection
is also influenced by surface effects. The nominal failure strains are captured by our simulations, and they are in good agreement with the simplified
model. Our results can be used for helping design strain gauge sensors and
nanodevices with self-detecting ability.
Keywords
Cite This Article
APA Style
Guo, J., Xu, Y., Jiang, Z., Liu, X., Cai, Y. (2020). A simplified model for buckling and post-buckling analysis of cu nanobeam under compression. Computer Modeling in Engineering & Sciences, 125(2), 611-623. https://doi.org/10.32604/cmes.2020.011148
Vancouver Style
Guo J, Xu Y, Jiang Z, Liu X, Cai Y. A simplified model for buckling and post-buckling analysis of cu nanobeam under compression. Comput Model Eng Sci. 2020;125(2):611-623 https://doi.org/10.32604/cmes.2020.011148
IEEE Style
J. Guo, Y. Xu, Z. Jiang, X. Liu, and Y. Cai "A Simplified Model for Buckling and Post-Buckling Analysis of Cu Nanobeam Under Compression," Comput. Model. Eng. Sci., vol. 125, no. 2, pp. 611-623. 2020. https://doi.org/10.32604/cmes.2020.011148