%0 Journal Article %A Lee, Joo-Chan %A Choi, Hyun-Pyo %A Kim, Jang-Hoon %A Kim, Jun-Won %A Jung, Da-Un %A Shin, Ji-Ho %A Seo, Jung-Taek %D 2020 %J Computers, Materials \& Continua %@ 1546-2226 %V 65 %N 1 %P 53--67 %T Identifying and Verifying Vulnerabilities through PLC Network Protocol and Memory Structure Analysis %M doi:10.32604/cmc.2020.011251 %U http://www.techscience.com/cmc/v65n1/39553